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A contactless method for determination of carrier lifetime,..:
Waldmeyer, Jürg
Journal of Applied Physics. 63 (1988) 6 - p. 1977-1983 , 1988
Link:
https://doi.org/10.1063/1.341097
RT Journal T1 <Title>A contactless method for determination of carrier lifetime, surface recombination velocity, and diffusion constant in semiconductors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.341097&Exemplar=1&LAN=DE A1 Waldmeyer, Jürg PB AIP Publishing YR 1988 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 63 IS 6 SP 1977 OP 1983 LK http://dx.doi.org/https://doi.org/10.1063/1.341097 DO https://doi.org/10.1063/1.341097 SF ELIB - SuUB Bremen
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