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1 Ergebnisse
1
Accurate extraction of ΔI/I due to random telegraph noise i..:
Lee, Ju-Wan
;
Park, Chan Hyeong
;
Shin, Hyungcheol
..
Applied Physics Letters. 98 (2011) 2 - p. , 2011
Link:
https://doi.org/10.1063/1.3543901
RT Journal T1
Accurate extraction of ΔI/I due to random telegraph noise in gate edge current of high-k n-type metal-oxide-semiconductor field-effect transistors under accumulation mode
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.3543901&Exemplar=1&LAN=DE A1 Lee, Ju-Wan A1 Park, Chan Hyeong A1 Shin, Hyungcheol A1 Park, Byung-Gook A1 Lee, Jong-Ho PB AIP Publishing YR 2011 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 98 IS 2 LK http://dx.doi.org/https://doi.org/10.1063/1.3543901 DO https://doi.org/10.1063/1.3543901 SF ELIB - SuUB Bremen
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