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A spectroscopic ellipsometry study of cerium dioxide thin f..:
Guo, S.
;
Arwin, H.
;
Jacobsen, S. N.
..
Journal of Applied Physics. 77 (1995) 10 - p. 5369-5376 , 1995
Link:
https://doi.org/10.1063/1.359225
RT Journal T1 <Title>A spectroscopic ellipsometry study of cerium dioxide thin films grown on sapphire by rf magnetron sputtering</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.359225&Exemplar=1&LAN=DE A1 Guo, S. A1 Arwin, H. A1 Jacobsen, S. N. A1 Järrendahl, K. A1 Helmersson, U. PB AIP Publishing YR 1995 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 77 IS 10 SP 5369 OP 5376 LK http://dx.doi.org/https://doi.org/10.1063/1.359225 DO https://doi.org/10.1063/1.359225 SF ELIB - SuUB Bremen
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