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1 Ergebnisse
1
Hot carrier effect on gate-induced drain leakage current in..:
Dai, Chih-Hao
;
Chang, Ting-Chang
;
Chu, Ann-Kuo
...
Applied Physics Letters. 99 (2011) 1 - p. , 2011
Link:
https://doi.org/10.1063/1.3608241
RT Journal T1
Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.3608241&Exemplar=1&LAN=DE A1 Dai, Chih-Hao A1 Chang, Ting-Chang A1 Chu, Ann-Kuo A1 Kuo, Yuan-Jui A1 Ho, Szu-Han A1 Hsieh, Tien-Yu A1 Lo, Wen-Hung A1 Chen, Ching-En A1 Shih, Jou-Miao A1 Chung, Wan-Lin A1 Dai, Bai-Shan A1 Chen, Hua-Mao A1 Xia, Guangrui A1 Cheng, Osbert A1 Huang, Cheng Tung PB AIP Publishing YR 2011 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 99 IS 1 LK http://dx.doi.org/https://doi.org/10.1063/1.3608241 DO https://doi.org/10.1063/1.3608241 SF ELIB - SuUB Bremen
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