I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
A study on interface and charge trapping properties of nitr..:
Lai, P. T.
;
Xu, J. P.
;
Lo, H. B.
.
Journal of Applied Physics. 82 (1997) 4 - p. 1947-1950 , 1997
Link:
https://doi.org/10.1063/1.366007
RT Journal T1 <Title>A study on interface and charge trapping properties of nitrided n-channel metal-oxide-semiconductor field-effect transistors by backsurface argon bombardment</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.366007&Exemplar=1&LAN=DE A1 Lai, P. T. A1 Xu, J. P. A1 Lo, H. B. A1 Cheng, Y. C. PB AIP Publishing YR 1997 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 82 IS 4 SP 1947 OP 1950 LK http://dx.doi.org/https://doi.org/10.1063/1.366007 DO https://doi.org/10.1063/1.366007 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
