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1 Ergebnisse
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Critical thickness and strain relaxation in lattice mismatc..:
Pinardi, K.
;
Jain, Uma
;
Jain, S. C.
...
Journal of Applied Physics. 83 (1998) 9 - p. 4724-4733 , 1998
Link:
https://doi.org/10.1063/1.367261
RT Journal T1 <Title>Critical thickness and strain relaxation in lattice mismatched II–VI semiconductor layers</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.367261&Exemplar=1&LAN=DE A1 Pinardi, K. A1 Jain, Uma A1 Jain, S. C. A1 Maes, H. E. A1 Van Overstraeten, R. A1 Willander, M. PB AIP Publishing YR 1998 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 83 IS 9 SP 4724 OP 4733 LK http://dx.doi.org/https://doi.org/10.1063/1.367261 DO https://doi.org/10.1063/1.367261 SF ELIB - SuUB Bremen
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