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1 Ergebnisse
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Synchrotron characterization of deep depletion epitaxial Ga..:
Owens, Alan
;
Bavdaz, M.
;
Kraft, S.
...
Journal of Applied Physics. 86 (1999) 8 - p. 4341-4347 , 1999
Link:
https://doi.org/10.1063/1.371367
RT Journal T1 <Title>Synchrotron characterization of deep depletion epitaxial GaAs detectors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.371367&Exemplar=1&LAN=DE A1 Owens, Alan A1 Bavdaz, M. A1 Kraft, S. A1 Peacock, A. A1 Strade, R. A1 Nenonen, S. A1 Andersson, H. A1 Gagliardi, M. A. A1 Gagliardi, T. A1 Graafsma, H. PB AIP Publishing YR 1999 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 86 IS 8 SP 4341 OP 4347 LK http://dx.doi.org/https://doi.org/10.1063/1.371367 DO https://doi.org/10.1063/1.371367 SF ELIB - SuUB Bremen
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