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1 Ergebnisse
1
Channel access resistance effects on charge carrier mobilit..:
Joo, Min-Kyu
;
Huh, Junghwan
;
Mouis, Mireille
...
Applied Physics Letters. 102 (2013) 5 - p. , 2013
Link:
https://doi.org/10.1063/1.4788708
RT Journal T1
Channel access resistance effects on charge carrier mobility and low-frequency noise in a polymethyl methacrylate passivated SnO2 nanowire field-effect transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.4788708&Exemplar=1&LAN=DE A1 Joo, Min-Kyu A1 Huh, Junghwan A1 Mouis, Mireille A1 Park, So Jeong A1 Jeon, Dae-Young A1 Jang, Doyoung A1 Lee, Jong-Heun A1 Kim, Gyu-Tae A1 Ghibaudo, Gérard PB AIP Publishing YR 2013 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 102 IS 5 LK http://dx.doi.org/https://doi.org/10.1063/1.4788708 DO https://doi.org/10.1063/1.4788708 SF ELIB - SuUB Bremen
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