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1 Ergebnisse
1
Nanometer-scale resolution and depth discrimination in near..:
Mei, Erwen
;
Higgins, Daniel A.
The Journal of Chemical Physics. 112 (2000) 18 - p. 7839-7847 , 2000
Link:
https://doi.org/10.1063/1.481388
RT Journal T1 <Title>Nanometer-scale resolution and depth discrimination in near-field optical microscopy studies of electric-field-induced molecular reorientation dynamics</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.481388&Exemplar=1&LAN=DE A1 Mei, Erwen A1 Higgins, Daniel A. PB AIP Publishing YR 2000 SN 0021-9606 SN 1089-7690 JF The Journal of Chemical Physics VO 112 IS 18 SP 7839 OP 7847 LK http://dx.doi.org/https://doi.org/10.1063/1.481388 DO https://doi.org/10.1063/1.481388 SF ELIB - SuUB Bremen
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