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1 Ergebnisse
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Examination of hot-carrier stress induced degradation on fi..:
Yang, Yi-Lin
;
Zhang, Wenqi
;
Yen, Tzu-Sung
...
Applied Physics Letters. 104 (2014) 8 - p. 083505 , 2014
Link:
https://doi.org/10.1063/1.4866437
RT Journal T1
Examination of hot-carrier stress induced degradation on fin field-effect transistor
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.4866437&Exemplar=1&LAN=DE A1 Yang, Yi-Lin A1 Zhang, Wenqi A1 Yen, Tzu-Sung A1 Hong, Jia-Jian A1 Wong, Jie-Chen A1 Ku, Chao-Chen A1 Wu, Tai-Hsuan A1 Wang, Tzuo-Li A1 Li, Chien-Yi A1 Wu, Bing-Tze A1 Lin, Shih-Hung A1 Yeh, Wen-Kuan PB AIP Publishing YR 2014 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 104 IS 8 SP 083505 LK http://dx.doi.org/https://doi.org/10.1063/1.4866437 DO https://doi.org/10.1063/1.4866437 SF ELIB - SuUB Bremen
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