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1 Ergebnisse
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Reproducible strain measurement in electronic devices by ap..:
Kim, Suhyun
;
Jung, Younheum
;
Kim, Joong Jung
...
AIP Advances. 4 (2014) 10 - p. 107107 , 2014
Link:
https://doi.org/10.1063/1.4897379
RT Journal T1
Reproducible strain measurement in electronic devices by applying integer multiple to scanning grating in scanning moiré fringe imaging
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.4897379&Exemplar=1&LAN=DE A1 Kim, Suhyun A1 Jung, Younheum A1 Kim, Joong Jung A1 Lee, Sunyoung A1 Lee, Haebum A1 Kondo, Yukihito PB AIP Publishing YR 2014 SN 2158-3226 JF AIP Advances VO 4 IS 10 SP 107107 LK http://dx.doi.org/https://doi.org/10.1063/1.4897379 DO https://doi.org/10.1063/1.4897379 SF ELIB - SuUB Bremen
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