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1 Ergebnisse
1
Impact of acceptor concentration on electrical properties a..:
Ortiz, G.
;
Strenger, C.
;
Uhnevionak, V.
...
Applied Physics Letters. 106 (2015) 6 - p. , 2015
Link:
https://doi.org/10.1063/1.4908123
RT Journal T1
Impact of acceptor concentration on electrical properties and density of interface states of 4H-SiC n-metal-oxide-semiconductor field effect transistors studied by Hall effect
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.4908123&Exemplar=1&LAN=DE A1 Ortiz, G. A1 Strenger, C. A1 Uhnevionak, V. A1 Burenkov, A. A1 Bauer, A. J. A1 Pichler, P. A1 Cristiano, F. A1 Bedel-Pereira, E. A1 Mortet, V. PB AIP Publishing YR 2015 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 106 IS 6 LK http://dx.doi.org/https://doi.org/10.1063/1.4908123 DO https://doi.org/10.1063/1.4908123 SF ELIB - SuUB Bremen
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