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Analysis of scattering mechanisms in zinc oxide films grown..:
Krajewski, Tomasz A.
;
Dybko, Krzysztof
;
Luka, Grzegorz
...
Journal of Applied Physics. 118 (2015) 3 - p. , 2015
Link:
https://doi.org/10.1063/1.4927294
RT Journal T1
Analysis of scattering mechanisms in zinc oxide films grown by the atomic layer deposition technique
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.4927294&Exemplar=1&LAN=DE A1 Krajewski, Tomasz A. A1 Dybko, Krzysztof A1 Luka, Grzegorz A1 Wachnicki, Lukasz A1 Kopalko, Krzysztof A1 Paszkowicz, Wojciech A1 Godlewski, Marek A1 Guziewicz, Elzbieta PB AIP Publishing YR 2015 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 118 IS 3 LK http://dx.doi.org/https://doi.org/10.1063/1.4927294 DO https://doi.org/10.1063/1.4927294 SF ELIB - SuUB Bremen
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