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Traceable atomic force microscopy of high-quality solvent-f..:
Lazzerini, Giovanni Mattia
;
Paternò, Giuseppe Maria
;
Tregnago, Giulia
...
Applied Physics Letters. 108 (2016) 5 - p. 053303 , 2016
Link:
https://doi.org/10.1063/1.4941227
RT Journal T1
Traceable atomic force microscopy of high-quality solvent-free crystals of [6,6]-phenyl-C61-butyric acid methyl ester
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.4941227&Exemplar=1&LAN=DE A1 Lazzerini, Giovanni Mattia A1 Paternò, Giuseppe Maria A1 Tregnago, Giulia A1 Treat, Neil A1 Stingelin, Natalie A1 Yacoot, Andrew A1 Cacialli, Franco PB AIP Publishing YR 2016 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 108 IS 5 SP 053303 LK http://dx.doi.org/https://doi.org/10.1063/1.4941227 DO https://doi.org/10.1063/1.4941227 SF ELIB - SuUB Bremen
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