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1 Ergebnisse
1
Evaluation of a flat-field grazing incidence spectrometer f..:
Dinh, Thanh Hung
;
Kondo, Yoshiki
;
Tamura, Toshiki
...
Review of Scientific Instruments. 87 (2016) 12 - p. 123106 , 2016
Link:
https://doi.org/10.1063/1.4971421
RT Journal T1
Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.4971421&Exemplar=1&LAN=DE A1 Dinh, Thanh Hung A1 Kondo, Yoshiki A1 Tamura, Toshiki A1 Ono, Yuichi A1 Hara, Hiroyuki A1 Oikawa, Hiroki A1 Yamamoto, Yoichi A1 Ishino, Masahiko A1 Nishikino, Masaharu A1 Makimura, Tetsuya A1 Dunne, Padraig A1 O'Sullivan, Gerry A1 Ohta, Shigeru A1 Kitano, Ken A1 Ejima, Takeo A1 Hatano, Tadashi A1 Higashiguchi, Takeshi PB AIP Publishing YR 2016 SN 0034-6748 SN 1089-7623 JF Review of Scientific Instruments VO 87 IS 12 SP 123106 LK http://dx.doi.org/https://doi.org/10.1063/1.4971421 DO https://doi.org/10.1063/1.4971421 SF ELIB - SuUB Bremen
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