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1 Ergebnisse
1
Determination of thicknesses and temperatures of crystallin..:
Franta, Daniel
;
Franta, Pavel
;
Vohánka, Jiří
..
Journal of Applied Physics. 123 (2018) 18 - p. , 2018
Link:
https://doi.org/10.1063/1.5026195
RT Journal T1 <Title>Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.5026195&Exemplar=1&LAN=DE A1 Franta, Daniel A1 Franta, Pavel A1 Vohánka, Jiří A1 Čermák, Martin A1 Ohlídal, Ivan PB AIP Publishing YR 2018 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 123 IS 18 LK http://dx.doi.org/https://doi.org/10.1063/1.5026195 DO https://doi.org/10.1063/1.5026195 SF ELIB - SuUB Bremen
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