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1 Ergebnisse
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Thickness-dependent microstructural properties of heteroepi..:
Luo, Sijun
;
Fluri, Aline
;
Zhang, Song
...
Journal of Applied Physics. 127 (2020) 6 - p. , 2020
Link:
https://doi.org/10.1063/1.5140451
RT Journal T1
Thickness-dependent microstructural properties of heteroepitaxial (00.1) CuFeO2 thin films on (00.1) sapphire by pulsed laser deposition
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_1.5140451&Exemplar=1&LAN=DE A1 Luo, Sijun A1 Fluri, Aline A1 Zhang, Song A1 Liu, Xue A1 Döbeli, Max A1 Harrington, George F. A1 Tu, Rong A1 Pergolesi, Daniele A1 Ishihara, Tasumi A1 Lippert, Thomas PB AIP Publishing YR 2020 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 127 IS 6 LK http://dx.doi.org/https://doi.org/10.1063/1.5140451 DO https://doi.org/10.1063/1.5140451 SF ELIB - SuUB Bremen
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