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1 Ergebnisse
1
Effect of deposition temperature on electrical properties o..:
Lin, Yun-Hsuan
;
Chen, Wen-Chung
;
Chen, Po-Hsun
...
Applied Physics Letters. 117 (2020) 2 - p. , 2020
Link:
https://doi.org/10.1063/5.0012679
RT Journal T1
Effect of deposition temperature on electrical properties of one-transistor-one-capacitor (1T1C) FeRAM devices
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_5.0012679&Exemplar=1&LAN=DE A1 Lin, Yun-Hsuan A1 Chen, Wen-Chung A1 Chen, Po-Hsun A1 Lin, Chih-Yang A1 Chang, Kai-Chun A1 Chang, Yen-Cheng A1 Yeh, Chien-Hung A1 Lin, Chein-Yu A1 Jin, Fu-Yuan A1 Chen, Kuan-Hsu A1 Kuo, Ting-Tzu A1 Hung, Wei-Chieh A1 Lee, Ya-Huan A1 Lin, Jia-Hong A1 Chang, Ting-Chang PB AIP Publishing YR 2020 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 117 IS 2 LK http://dx.doi.org/https://doi.org/10.1063/5.0012679 DO https://doi.org/10.1063/5.0012679 SF ELIB - SuUB Bremen
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