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1 Ergebnisse
1
Generation of sidewall defects in InGaN/GaN blue micro-LEDs..:
Islam, Abu Bashar Mohammad Hamidul
;
Kim, Tae Kyoung
;
Shin, Dong-Soo
..
Applied Physics Letters. 121 (2022) 1 - p. , 2022
Link:
https://doi.org/10.1063/5.0089650
RT Journal T1 <Title>Generation of sidewall defects in InGaN/GaN blue micro-LEDs under forward-current stress</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_5.0089650&Exemplar=1&LAN=DE A1 Islam, Abu Bashar Mohammad Hamidul A1 Kim, Tae Kyoung A1 Shin, Dong-Soo A1 Shim, Jong-In A1 Kwak, Joon Seop PB AIP Publishing YR 2022 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 121 IS 1 LK http://dx.doi.org/https://doi.org/10.1063/5.0089650 DO https://doi.org/10.1063/5.0089650 SF ELIB - SuUB Bremen
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