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1 Ergebnisse
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Temperature dependence of avalanche breakdown in 4H-SiC dev..:
Steinmann, Philipp
;
Hull, Brett
;
Ji, In-Hwan
..
Journal of Applied Physics. 133 (2023) 23 - p. , 2023
Link:
https://doi.org/10.1063/5.0152385
RT Journal T1
Temperature dependence of avalanche breakdown in 4H-SiC devices
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_5.0152385&Exemplar=1&LAN=DE A1 Steinmann, Philipp A1 Hull, Brett A1 Ji, In-Hwan A1 Lichtenwalner, Daniel A1 Van Brunt, Edward PB AIP Publishing YR 2023 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 133 IS 23 LK http://dx.doi.org/https://doi.org/10.1063/5.0152385 DO https://doi.org/10.1063/5.0152385 SF ELIB - SuUB Bremen
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