I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Gate leakage modeling in lateralβ-Ga2O3 MOSFETs with Al2O3 ..:
Fregolent, Manuel
;
Brusaterra, Enrico
;
De Santi, Carlo
...
Applied Physics Letters. 123 (2023) 10 - p. , 2023
Link:
https://doi.org/10.1063/5.0154878
RT Journal T1
Gate leakage modeling in lateralβ-Ga2O3 MOSFETs with Al2O3 gate dielectric
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_5.0154878&Exemplar=1&LAN=DE A1 Fregolent, Manuel A1 Brusaterra, Enrico A1 De Santi, Carlo A1 Tetzner, Kornelius A1 Würfl, Joachim A1 Meneghesso, Gaudenzio A1 Zanoni, Enrico A1 Meneghini, Matteo PB AIP Publishing YR 2023 SN 0003-6951 SN 1077-3118 JF Applied Physics Letters VO 123 IS 10 LK http://dx.doi.org/https://doi.org/10.1063/5.0154878 DO https://doi.org/10.1063/5.0154878 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)