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Reliable measurement of the density of states including occ..:
Nakazawa, Ryotaro
;
Matsuzaki, Atsushi
;
Shimizu, Kohei
...
Journal of Applied Physics. 135 (2024) 8 - p. , 2024
Link:
https://doi.org/10.1063/5.0185405
RT Journal T1
Reliable measurement of the density of states including occupied in-gap states of an amorphous In–Ga–Zn–O thin film via photoemission spectroscopies: Direct observation of light-induced in-gap states
UL https://suche.suub.uni-bremen.de/peid=cr-10.1063_5.0185405&Exemplar=1&LAN=DE A1 Nakazawa, Ryotaro A1 Matsuzaki, Atsushi A1 Shimizu, Kohei A1 Nakamura, Ikuko A1 Kawashima, Emi A1 Makita, Seiji A1 Tanaka, Kiyohisa A1 Yasuno, Satoshi A1 Sato, Haruki A1 Yoshida, Hiroyuki A1 Abdi-Jalebi, Mojtaba A1 Stranks, Samuel D. A1 Tadano, Shohei A1 Krüger, Peter A1 Tanaka, Yuya A1 Tokairin, Hiroshi A1 Ishii, Hisao PB AIP Publishing YR 2024 SN 0021-8979 SN 1089-7550 JF Journal of Applied Physics VO 135 IS 8 LK http://dx.doi.org/https://doi.org/10.1063/5.0185405 DO https://doi.org/10.1063/5.0185405 SF ELIB - SuUB Bremen
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