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Origin of radiation tolerance in amorphous Ge2Sb2Te5phase-c..:
Konstantinou, Konstantinos
;
Lee, Tae Hoon
;
Mocanu, Felix C.
.
Proceedings of the National Academy of Sciences. 115 (2018) 21 - p. 5353-5358 , 2018
Link:
https://doi.org/10.1073/pnas.1800638115
RT Journal T1 <Title>Origin of radiation tolerance in amorphous Ge2Sb2Te5phase-change random-access memory material</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1073_pnas.1800638115&Exemplar=1&LAN=DE A1 Konstantinou, Konstantinos A1 Lee, Tae Hoon A1 Mocanu, Felix C. A1 Elliott, Stephen R. PB Proceedings of the National Academy of Sciences YR 2018 SN 0027-8424 SN 1091-6490 JF Proceedings of the National Academy of Sciences VO 115 IS 21 SP 5353 OP 5358 LK http://dx.doi.org/https://doi.org/10.1073/pnas.1800638115 DO https://doi.org/10.1073/pnas.1800638115 SF ELIB - SuUB Bremen
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