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Resonant inelastic X-ray scattering determination of the el..:
Yan, James J.
;
Kroll, Thomas
;
Baker, Michael L.
...
Proceedings of the National Academy of Sciences. 116 (2019) 8 - p. 2854-2859 , 2019
Link:
https://doi.org/10.1073/pnas.1815981116
RT Journal T1 <Title>Resonant inelastic X-ray scattering determination of the electronic structure of oxyhemoglobin and its model complex</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1073_pnas.1815981116&Exemplar=1&LAN=DE A1 Yan, James J. A1 Kroll, Thomas A1 Baker, Michael L. A1 Wilson, Samuel A. A1 Decréau, Richard A1 Lundberg, Marcus A1 Sokaras, Dimosthenis A1 Glatzel, Pieter A1 Hedman, Britt A1 Hodgson, Keith O. A1 Solomon, Edward I. PB Proceedings of the National Academy of Sciences YR 2019 SN 0027-8424 SN 1091-6490 JF Proceedings of the National Academy of Sciences VO 116 IS 8 SP 2854 OP 2859 LK http://dx.doi.org/https://doi.org/10.1073/pnas.1815981116 DO https://doi.org/10.1073/pnas.1815981116 SF ELIB - SuUB Bremen
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