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Large-scale analysis of test–retest reliabilities of self-r..:

Enkavi, A. Zeynep ; Eisenberg, Ian W. ; Bissett, Patrick G....
Proceedings of the National Academy of Sciences.  116 (2019)  12 - p. 5472-5477 , 2019
Link: https://doi.org/10.1073/pnas.1818430116