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1 Ergebnisse
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Shot noise-mitigated secondary electron imaging with ion co..:
Agarwal, Akshay
;
Kasaei, Leila
;
He, Xinglin
...
Proceedings of the National Academy of Sciences. 121 (2024) 31 - p. , 2024
Link:
https://doi.org/10.1073/pnas.2401246121
RT Journal T1 <Title>Shot noise-mitigated secondary electron imaging with ion count-aided microscopy</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1073_pnas.2401246121&Exemplar=1&LAN=DE A1 Agarwal, Akshay A1 Kasaei, Leila A1 He, Xinglin A1 Kitichotkul, Ruangrawee A1 Hitit, Oğuz Kağan A1 Peng, Minxu A1 Schultz, J. Albert A1 Feldman, Leonard C. A1 Goyal, Vivek K PB Proceedings of the National Academy of Sciences YR 2024 SN 0027-8424 SN 1091-6490 JF Proceedings of the National Academy of Sciences VO 121 IS 31 LK http://dx.doi.org/https://doi.org/10.1073/pnas.2401246121 DO https://doi.org/10.1073/pnas.2401246121 SF ELIB - SuUB Bremen
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