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1 Ergebnisse
1
Universal and robust testing of stuck-open faults in Reed–M..:
Das, Debesh K.
;
Chakraborty, Susanta
;
Bhattacharya, Bhargab B.
International Journal of Electronics. 90 (2003) 1 - p. 1-11 , 2003
Link:
https://doi.org/10.1080/0020721031000147318
RT Journal T1
Universal and robust testing of stuck-open faults in Reed–Muller canonical CMOS circuits
UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_0020721031000147318&Exemplar=1&LAN=DE A1 Das, Debesh K. A1 Chakraborty, Susanta A1 Bhattacharya, Bhargab B. PB Informa UK Limited YR 2003 SN 0020-7217 SN 1362-3060 JF International Journal of Electronics VO 90 IS 1 SP 1 OP 11 LK http://dx.doi.org/https://doi.org/10.1080/0020721031000147318 DO https://doi.org/10.1080/0020721031000147318 SF ELIB - SuUB Bremen
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