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1 Ergebnisse
1
High-k dielectrics based field plate edge termination engin..:
Shankar, Bhawani
;
Gupta, Sanjeev K.
;
Taube, William R.
.
International Journal of Electronics. 103 (2016) 12 - p. 2064-2074 , 2016
Link:
https://doi.org/10.1080/00207217.2016.1178340
RT Journal T1
High-k dielectrics based field plate edge termination engineering in 4H-SiC Schottky diode
UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_00207217.2016.1178340&Exemplar=1&LAN=DE A1 Shankar, Bhawani A1 Gupta, Sanjeev K. A1 Taube, William R. A1 Akhtar, J. PB Informa UK Limited YR 2016 SN 0020-7217 SN 1362-3060 JF International Journal of Electronics VO 103 IS 12 SP 2064 OP 2074 LK http://dx.doi.org/https://doi.org/10.1080/00207217.2016.1178340 DO https://doi.org/10.1080/00207217.2016.1178340 SF ELIB - SuUB Bremen
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