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1 Ergebnisse
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Study of complete interconnect reliability for a GaAs MMIC ..:
Lin, Qian
;
Wu, Haifeng
;
Chen, Shan-ji
...
International Journal of Electronics. 105 (2017) 5 - p. 794-805 , 2017
Link:
https://doi.org/10.1080/00207217.2017.1409806
RT Journal T1 <Title>Study of complete interconnect reliability for a GaAs MMIC power amplifier</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_00207217.2017.1409806&Exemplar=1&LAN=DE A1 Lin, Qian A1 Wu, Haifeng A1 Chen, Shan-ji A1 Jia, Guoqing A1 Jiang, Wei A1 Chen, Chao PB Informa UK Limited YR 2017 SN 0020-7217 SN 1362-3060 JF International Journal of Electronics VO 105 IS 5 SP 794 OP 805 LK http://dx.doi.org/https://doi.org/10.1080/00207217.2017.1409806 DO https://doi.org/10.1080/00207217.2017.1409806 SF ELIB - SuUB Bremen
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