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1 Ergebnisse
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Threshold-voltage instability caused by the hot-carrier sub..:
EL-HENNAWY, ADEL E.
;
AL-BARAKATI, GHALI G.
;
AL-HARBI, TALAL S.
International Journal of Electronics. 75 (1993) 1 - p. 49-55 , 1993
Link:
https://doi.org/10.1080/00207219308907086
RT Journal T1
Threshold-voltage instability caused by the hot-carrier substrate current in MOSFETs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_00207219308907086&Exemplar=1&LAN=DE A1 EL-HENNAWY, ADEL E. A1 AL-BARAKATI, GHALI G. A1 AL-HARBI, TALAL S. PB Informa UK Limited YR 1993 SN 0020-7217 SN 1362-3060 JF International Journal of Electronics VO 75 IS 1 SP 49 OP 55 LK http://dx.doi.org/https://doi.org/10.1080/00207219308907086 DO https://doi.org/10.1080/00207219308907086 SF ELIB - SuUB Bremen
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