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Transient simulation of lossy interconnects in VLSI by a re..:
XU, QIN-WEI
;
LI, ZHENG-FAN
;
WANG, JUN
International Journal of Electronics. 85 (1998) 2 - p. 153-164 , 1998
Link:
https://doi.org/10.1080/002072198134229
RT Journal T1 <Title>Transient simulation of lossy interconnects in VLSI by a recursive algorithm</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_002072198134229&Exemplar=1&LAN=DE A1 XU, QIN-WEI A1 LI, ZHENG-FAN A1 WANG, JUN PB Informa UK Limited YR 1998 SN 0020-7217 SN 1362-3060 JF International Journal of Electronics VO 85 IS 2 SP 153 OP 164 LK http://dx.doi.org/https://doi.org/10.1080/002072198134229 DO https://doi.org/10.1080/002072198134229 SF ELIB - SuUB Bremen
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