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Metastability of SOI CMOS latches:
TRETZ, C.
;
CHUANG, C. T.
;
TERMAN, L.
...
International Journal of Electronics. 86 (1999) 7 - p. 807-813 , 1999
Link:
https://doi.org/10.1080/002072199133049
RT Journal T1 <Title>Metastability of SOI CMOS latches</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_002072199133049&Exemplar=1&LAN=DE A1 TRETZ, C. A1 CHUANG, C. T. A1 TERMAN, L. A1 ANDERSON, C. A1 PELELLA, MARIO A1 ZUKOWSKI, C. PB Informa UK Limited YR 1999 SN 0020-7217 SN 1362-3060 JF International Journal of Electronics VO 86 IS 7 SP 807 OP 813 LK http://dx.doi.org/https://doi.org/10.1080/002072199133049 DO https://doi.org/10.1080/002072199133049 SF ELIB - SuUB Bremen
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