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Fuzzy-based risk priority number in FMEA for semiconductor ..:
Yeh, Tsu-Ming
;
Chen, Long-Yi
International Journal of Production Research. 52 (2013) 2 - p. 539-549 , 2013
Link:
https://doi.org/10.1080/00207543.2013.837984
RT Journal T1 <Title>Fuzzy-based risk priority number in FMEA for semiconductor wafer processes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_00207543.2013.837984&Exemplar=1&LAN=DE A1 Yeh, Tsu-Ming A1 Chen, Long-Yi PB Informa UK Limited YR 2013 SN 0020-7543 SN 1366-588X JF International Journal of Production Research VO 52 IS 2 SP 539 OP 549 LK http://dx.doi.org/https://doi.org/10.1080/00207543.2013.837984 DO https://doi.org/10.1080/00207543.2013.837984 SF ELIB - SuUB Bremen
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