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Implementing virtual metrology for in-line quality control ..:
Pan, Jason Chao-Hsien
;
Tai, Damon HE
International Journal of Systems Science. 40 (2009) 5 - p. 461-470 , 2009
Link:
https://doi.org/10.1080/00207720802645204
RT Journal T1
Implementing virtual metrology for in-line quality control in semiconductor manufacturing
UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_00207720802645204&Exemplar=1&LAN=DE A1 Pan, Jason Chao-Hsien A1 Tai, Damon HE PB Informa UK Limited YR 2009 SN 0020-7721 SN 1464-5319 JF International Journal of Systems Science VO 40 IS 5 SP 461 OP 470 LK http://dx.doi.org/https://doi.org/10.1080/00207720802645204 DO https://doi.org/10.1080/00207720802645204 SF ELIB - SuUB Bremen
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