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A study of sinusoidal-excited wall charge behavior in EEFL ..:
Hsieh, Guan-Chyun
;
Tsai, Cheng-Yuan
Journal of the Chinese Institute of Engineers. 37 (2012) 1 - p. 54-70 , 2012
Link:
https://doi.org/10.1080/02533839.2012.751301
RT Journal T1 <Title>A study of sinusoidal-excited wall charge behavior in EEFL by parallel-loaded series resonance</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_02533839.2012.751301&Exemplar=1&LAN=DE A1 Hsieh, Guan-Chyun A1 Tsai, Cheng-Yuan PB Informa UK Limited YR 2012 SN 0253-3839 SN 2158-7299 JF Journal of the Chinese Institute of Engineers VO 37 IS 1 SP 54 OP 70 LK http://dx.doi.org/https://doi.org/10.1080/02533839.2012.751301 DO https://doi.org/10.1080/02533839.2012.751301 SF ELIB - SuUB Bremen
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