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Buried interface characterization in optoelectronic materia..:
Benhaddou, Driss
;
Montgomery, Paul C.
;
Montaner, Denis
.
Journal of Modern Optics. 48 (2001) 3 - p. 533-547 , 2001
Link:
https://doi.org/10.1080/09500340108230930
RT Journal T1
Buried interface characterization in optoelectronic materials by interference microscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_09500340108230930&Exemplar=1&LAN=DE A1 Benhaddou, Driss A1 Montgomery, Paul C. A1 Montaner, Denis A1 Bonnafé, Jacques PB Informa UK Limited YR 2001 SN 0950-0340 SN 1362-3044 JF Journal of Modern Optics VO 48 IS 3 SP 533 OP 547 LK http://dx.doi.org/https://doi.org/10.1080/09500340108230930 DO https://doi.org/10.1080/09500340108230930 SF ELIB - SuUB Bremen
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