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Digital twin-based research on the prediction method for th..:
Wang, Yunrui
;
Li, Yan
;
Ren, Wenzhe
International Journal of Computer Integrated Manufacturing. 34 (2021) 12 - p. 1382-1393 , 2021
Link:
https://doi.org/10.1080/0951192x.2021.1972464
RT Journal T1 <Title>Digital twin-based research on the prediction method for the complex product assembly abnormal events</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_0951192x.2021.1972464&Exemplar=1&LAN=DE A1 Wang, Yunrui A1 Li, Yan A1 Ren, Wenzhe PB Informa UK Limited YR 2021 SN 0951-192X SN 1362-3052 JF International Journal of Computer Integrated Manufacturing VO 34 IS 12 SP 1382 OP 1393 LK http://dx.doi.org/https://doi.org/10.1080/0951192x.2021.1972464 DO https://doi.org/10.1080/0951192x.2021.1972464 SF ELIB - SuUB Bremen
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