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An improved automatic defect identification system on natur..:

Gan, Y.S. ; Liong, Sze-Teng ; Wang, Shih-Yuan.
International Journal of Computer Integrated Manufacturing.  35 (2022)  12 - p. 1378-1394 , 2022
Link: https://doi.org/10.1080/0951192x.2022.2048421