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Zero defect manufacturing: a self-adaptive defect predictio..:

Verna, Elisa ; Genta, Gianfranco ; Galetto, Maurizio.
International Journal of Computer Integrated Manufacturing.  36 (2022)  1 - p. 155-168 , 2022
Link: https://doi.org/10.1080/0951192x.2022.2081360