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The more you avoid, the worse you will get: a cross-lagged ..:
Jiang, Min
;
Ding, Wan
;
Wang, Xiaoyue
...
Journal of Mental Health. 32 (2023) 3 - p. 662-669 , 2023
Link:
https://doi.org/10.1080/09638237.2023.2210665
RT Journal T1
The more you avoid, the worse you will get: a cross-lagged panel model of shyness, mobile phone dependence and depression
UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_09638237.2023.2210665&Exemplar=1&LAN=DE A1 Jiang, Min A1 Ding, Wan A1 Wang, Xiaoyue A1 Sun, Zhaoxing A1 Li, Weijian A1 Xie, Ruibo A1 Nguyen, Thi Phuong PB Informa UK Limited YR 2023 SN 0963-8237 SN 1360-0567 JF Journal of Mental Health VO 32 IS 3 SP 662 OP 669 LK http://dx.doi.org/https://doi.org/10.1080/09638237.2023.2210665 DO https://doi.org/10.1080/09638237.2023.2210665 SF ELIB - SuUB Bremen
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