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1 Ergebnisse
1
Wafer probe mark area estimation via digital image processi..:
Wang, Chau-Shing
;
Chang, Wen-Liang
Journal of the Chinese Institute of Industrial Engineers. 29 (2012) 4 - p. 237-245 , 2012
Link:
https://doi.org/10.1080/10170669.2012.684409
RT Journal T1 <Title>Wafer probe mark area estimation via digital image processing approach</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_10170669.2012.684409&Exemplar=1&LAN=DE A1 Wang, Chau-Shing A1 Chang, Wen-Liang PB Informa UK Limited YR 2012 SN 1017-0669 SN 2151-7606 JF Journal of the Chinese Institute of Industrial Engineers VO 29 IS 4 SP 237 OP 245 LK http://dx.doi.org/https://doi.org/10.1080/10170669.2012.684409 DO https://doi.org/10.1080/10170669.2012.684409 SF ELIB - SuUB Bremen
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