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1 Ergebnisse
1
Study of bias-induced total ionizing dose radiation damage ..:
Liang, Xiaowen
;
Pu, Xiaojuan
;
Feng, Haonan
...
Radiation Effects and Defects in Solids. 178 (2023) 3-4 - p. 510-520 , 2023
Link:
https://doi.org/10.1080/10420150.2022.2163485
RT Journal T1
Study of bias-induced total ionizing dose radiation damage mechanism in SiC MOSFETs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_10420150.2022.2163485&Exemplar=1&LAN=DE A1 Liang, Xiaowen A1 Pu, Xiaojuan A1 Feng, Haonan A1 Sun, Jing A1 Wei, Ying A1 Zhang, Dan A1 Li, Yudong A1 Yu, Xuefeng A1 Guo, Qi PB Informa UK Limited YR 2023 SN 1042-0150 SN 1029-4953 JF Radiation Effects and Defects in Solids VO 178 IS 3-4 SP 510 OP 520 LK http://dx.doi.org/https://doi.org/10.1080/10420150.2022.2163485 DO https://doi.org/10.1080/10420150.2022.2163485 SF ELIB - SuUB Bremen
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