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1 Ergebnisse
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Integrating content-based image retrieval and deep learning..:
Chiu, Ming-Chuan
;
Lee, Yen-Han
;
Chen, Tao-Ming
Journal of Industrial and Production Engineering. 39 (2022) 8 - p. 614-628 , 2022
Link:
https://doi.org/10.1080/21681015.2022.2074155
RT Journal T1 <Title>Integrating content-based image retrieval and deep learning to improve wafer bin map defect patterns classification</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1080_21681015.2022.2074155&Exemplar=1&LAN=DE A1 Chiu, Ming-Chuan A1 Lee, Yen-Han A1 Chen, Tao-Ming PB Informa UK Limited YR 2022 SN 2168-1015 SN 2168-1023 JF Journal of Industrial and Production Engineering VO 39 IS 8 SP 614 OP 628 LK http://dx.doi.org/https://doi.org/10.1080/21681015.2022.2074155 DO https://doi.org/10.1080/21681015.2022.2074155 SF ELIB - SuUB Bremen
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