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Characterization of CdSxTe1-xthin films through thermoelect..:
Jácome, C
;
Flórez, M
;
Gurevich, Y G
..
Journal of Physics D: Applied Physics. 34 (2001) 12 - p. 1862-1867 , 2001
Link:
https://doi.org/10.1088/0022-3727/34/12/315
RT Journal T1 <Title>Characterization of CdSxTe1-xthin films through thermoelectric power measurements</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0022-3727_34_12_315&Exemplar=1&LAN=DE A1 Jácome, C A1 Flórez, M A1 Gurevich, Y G A1 Giraldo, J A1 Gordillo, G PB IOP Publishing YR 2001 SN 0022-3727 SN 1361-6463 JF Journal of Physics D: Applied Physics VO 34 IS 12 SP 1862 OP 1867 LK http://dx.doi.org/https://doi.org/10.1088/0022-3727/34/12/315 DO https://doi.org/10.1088/0022-3727/34/12/315 SF ELIB - SuUB Bremen
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