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Properties of solid state devices with significant impurity..:
Gil, Y
;
Tsur, Y
;
Umurhan, O M
.
Journal of Physics D: Applied Physics. 41 (2008) 13 - p. 135106 , 2008
Link:
https://doi.org/10.1088/0022-3727/41/13/135106
RT Journal T1 <Title>Properties of solid state devices with significant impurity hopping conduction</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0022-3727_41_13_135106&Exemplar=1&LAN=DE A1 Gil, Y A1 Tsur, Y A1 Umurhan, O M A1 Riess, I PB IOP Publishing YR 2008 SN 0022-3727 SN 1361-6463 JF Journal of Physics D: Applied Physics VO 41 IS 13 SP 135106 LK http://dx.doi.org/https://doi.org/10.1088/0022-3727/41/13/135106 DO https://doi.org/10.1088/0022-3727/41/13/135106 SF ELIB - SuUB Bremen
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