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Microscopic investigation of InGaN/GaN heterostructure lase..:
Lochthofen, A
;
Mertin, W
;
Bacher, G
...
Journal of Physics D: Applied Physics. 41 (2008) 13 - p. 135115 , 2008
Link:
https://doi.org/10.1088/0022-3727/41/13/135115
RT Journal T1 <Title>Microscopic investigation of InGaN/GaN heterostructure laser diode degradation using Kelvin probe force microscopy</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0022-3727_41_13_135115&Exemplar=1&LAN=DE A1 Lochthofen, A A1 Mertin, W A1 Bacher, G A1 Furitsch, M A1 Brüderl, G A1 Strauss, U A1 Härle, V PB IOP Publishing YR 2008 SN 0022-3727 SN 1361-6463 JF Journal of Physics D: Applied Physics VO 41 IS 13 SP 135115 LK http://dx.doi.org/https://doi.org/10.1088/0022-3727/41/13/135115 DO https://doi.org/10.1088/0022-3727/41/13/135115 SF ELIB - SuUB Bremen
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