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1 Ergebnisse
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Dynamics of negative bias thermal stress-induced threshold ..:
Oh, Seungha
;
Yang, Bong Seob
;
Kim, Yoon Jang
...
Journal of Physics D: Applied Physics. 47 (2014) 16 - p. 165103 , 2014
Link:
https://doi.org/10.1088/0022-3727/47/16/165103
RT Journal T1
Dynamics of negative bias thermal stress-induced threshold voltage shifts in indium zinc oxide transistors: impact of the crystalline structure on the activation energy barrier
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0022-3727_47_16_165103&Exemplar=1&LAN=DE A1 Oh, Seungha A1 Yang, Bong Seob A1 Kim, Yoon Jang A1 Choi, Yu Jin A1 Kim, Un Ki A1 Han, Sang Jin A1 Lee, Hong Woo A1 Kim, Hyuk Jin A1 Kim, Sungmin A1 Jeong, Jae Kyeong A1 Kim, Hyeong Joon PB IOP Publishing YR 2014 SN 0022-3727 SN 1361-6463 JF Journal of Physics D: Applied Physics VO 47 IS 16 SP 165103 LK http://dx.doi.org/https://doi.org/10.1088/0022-3727/47/16/165103 DO https://doi.org/10.1088/0022-3727/47/16/165103 SF ELIB - SuUB Bremen
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