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1 Ergebnisse
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Positive gate bias instability alleviated by self-passivati..:
Li, GongTan
;
Yang, Bo-Ru
;
Liu, Chuan
...
Journal of Physics D: Applied Physics. 48 (2015) 47 - p. 475107 , 2015
Link:
https://doi.org/10.1088/0022-3727/48/47/475107
RT Journal T1 <Title>Positive gate bias instability alleviated by self-passivation effect in amorphous InGaZnO thin-film transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0022-3727_48_47_475107&Exemplar=1&LAN=DE A1 Li, GongTan A1 Yang, Bo-Ru A1 Liu, Chuan A1 Lee, Chia-Yu A1 Tseng, Chih-Yuan A1 Lo, Chang-Cheng A1 Lien, Alan A1 Deng, ShaoZhi A1 Shieh, Han-Ping D A1 Xu, NingSheng PB IOP Publishing YR 2015 SN 0022-3727 SN 1361-6463 JF Journal of Physics D: Applied Physics VO 48 IS 47 SP 475107 LK http://dx.doi.org/https://doi.org/10.1088/0022-3727/48/47/475107 DO https://doi.org/10.1088/0022-3727/48/47/475107 SF ELIB - SuUB Bremen
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