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1 Ergebnisse
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Lateral n–i–p junction characterization using laser microsc..:
Muscat, S
;
Nash, G R
;
Hall, R S
...
Semiconductor Science and Technology. 20 (2005) 5 - p. 406-411 , 2005
Link:
https://doi.org/10.1088/0268-1242/20/5/014
RT Journal T1 <Title>Lateral n–i–p junction characterization using laser microscopy</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0268-1242_20_5_014&Exemplar=1&LAN=DE A1 Muscat, S A1 Nash, G R A1 Hall, R S A1 Smith, S J A1 Bartlett, C J A1 Nash, K J A1 Jefferson, J H A1 Buckle, L A1 Emeny, M T A1 Ashley, T PB IOP Publishing YR 2005 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 20 IS 5 SP 406 OP 411 LK http://dx.doi.org/https://doi.org/10.1088/0268-1242/20/5/014 DO https://doi.org/10.1088/0268-1242/20/5/014 SF ELIB - SuUB Bremen
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