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1 Ergebnisse
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Blistering study of H-implanted InGaAs for potential hetero..:
Dadwal, U
;
Kumar, A
;
Scholz, R
...
Semiconductor Science and Technology. 26 (2011) 8 - p. 085032 , 2011
Link:
https://doi.org/10.1088/0268-1242/26/8/085032
RT Journal T1 <Title>Blistering study of H-implanted InGaAs for potential heterointegration applications</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0268-1242_26_8_085032&Exemplar=1&LAN=DE A1 Dadwal, U A1 Kumar, A A1 Scholz, R A1 Reiche, M A1 Kumar, P A1 Boehm, G A1 Amann, M C A1 Singh, R PB IOP Publishing YR 2011 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 26 IS 8 SP 085032 LK http://dx.doi.org/https://doi.org/10.1088/0268-1242/26/8/085032 DO https://doi.org/10.1088/0268-1242/26/8/085032 SF ELIB - SuUB Bremen
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